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Glossary

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Revision as of 11:21, 25 August 2017 by Ian McIntosh (talk | contribs) (Migrated entries for Q-T to new namespace.)
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U

Update-DR 
A noted sub-operation of DR-Scan that represents the action of synchronizing all change actions of the target 1149.1 register or 1687 instrument that is active under the current selected instruction when the 1149.1-SM is in the Update-DR state at the falling-edge of TCK.

V

Vector Proxy 
The delegation by the Test Control System of the application of vectors to a remote target outside of the current controller. See also Scan Proxy and Test Step Proxy.

W

Wrapper-Boundary Register (WBR) 
An IEEE Std 1500 serial shift-register similar to the BSR of a device, but with more defined capabilities, that is meant to wrap around a core to provide the ability to test the core in isolation (in-facing mode), or the test logic attached to the core using the wrapper instead of the core (out-facing mode).
Wrapper-Bypass Register (WBY) 
A single-bit register applied in parallel to the IEEE Std 1500 registers (e.g. WIR, CDR, WDR) that can be used to reduce the Wrapper’s scan shift-path to only 1 bit.
Wrapper Instruction Register (WIR) 
The local instruction register associated with the IEEE Std 1500 TAM.
WSI 
A IEEE Std 1500 TAM signal, Wrapper-Serial-Input, that is the beginning of the serial scan-path for the IEEE Std 1500 Test Wrapper.
WSI-WSO 
The abbreviation for the IEEE Std 1500 serial scan-path, Wrapper-Serial-Input to Wrapper-Serial-Output.
WSO 
A IEEE Std 1500 TAM signal, Wrapper-Serial-Output, that is the end of the serial scan-path for the IEEE Std 1500 Test Wrapper.

X

XBST 
See External Boundary Scan Test.

Y

Z