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Glossary
Glossary Index
- Glossary:ATCA
- Glossary:ATPG
- Glossary:Access Interface
- Glossary:Access Link
- Glossary:Access Point
- Glossary:Application Specific Integrated Circuit
- Glossary:Board Level Self-Test
- Glossary:Bottom-up Approach
- Glossary:Boundary
- Glossary:Boundary-Scan
- Glossary:Boundary Scan Description Language
- Glossary:Boundary Scan Enhanced
- Glossary:Boundary Scan Register
- Glossary:Built-In Self-Test
- Glossary:Built-In Test
- Glossary:Bypass
- Glossary:Capture-Shift-Update
- Glossary:Complex Programmable Logic Device
- Glossary:DR-Scan
- Glossary:Daisy Chain Configuration
- Glossary:Data Link
- Glossary:Diagnosis
- Glossary:Diagnostic Tests
- Glossary:Diagnostics
- Glossary:EBST
- Glossary:Embedded Boundary Scan Test
- Glossary:Embedded Test Controller
- Glossary:External Boundary Scan Test
- Glossary:Field Programmable Gate Array
- Glossary:Field Replaceable Unit
- Glossary:Gateway
- Glossary:General-purpose Native jtAg Tester
- Glossary:HLS--High-Level Synthesis
- Glossary:Hierarchical Instrument
- Glossary:I2C Bus
- Glossary:IPMI
- Glossary:IR-Scan
- Glossary:Instrument
- Glossary:Internet Service Provider (ISP)
- Glossary:JTAG
- Glossary:JTAG Capture-Shift-Update
- Glossary:JTAG Protocol Manager
- Glossary:JTAG Switch Module
- Glossary:LRU
- Glossary:MDIO
- Glossary:Master Test Controller
- Glossary:Method
- Glossary:Multi-Drop Configuration
- Glossary:No Fault Found
- Glossary:No Trouble Found
- Glossary:PMBus
- Glossary:Pattern Retargeting
- Glossary:Programmable Array Logic
- Glossary:Project Authorization Request
- Glossary:Protocol Adapter
- Glossary:Public Instructions
- Glossary:RASM
- Glossary:REST
- Glossary:RESTful Web Service
- Glossary:Radial Configuration
- Glossary:Retarget
- Glossary:Retargeter
- Glossary:Ring Configuration
- Glossary:Router
- Glossary:SJTAG Control System
- Glossary:SJTAG Manager
- Glossary:SMBus
- Glossary:SRA--Shop Replaceable Assemblies
- Glossary:STAM Callback
- Glossary:Scan Proxy
- Glossary:Selector
- Glossary:Sensor
- Glossary:Shift-DR
- Glossary:Shift-IR
- Glossary:Shop Replaceable Unit
- Glossary:Star Configuration
- Glossary:System
- Glossary:TCK
- Glossary:TDI
- Glossary:TDI-TDO
- Glossary:TDO
- Glossary:TLR
- Glossary:TMS
- Glossary:TRST*
- Glossary:Test Access Mechanism
- Glossary:Test Access Port
- Glossary:Test Data Register
- Glossary:Test Salvage
- Glossary:Test Step
- Glossary:Test Step Proxy
- Glossary:Testability
- Glossary:Testability Partitioning
- Glossary:Top-down Approach
- Glossary:Update-DR
- Glossary:Vector Proxy
- Glossary:Virtual Access Point
- Glossary:WSI
- Glossary:WSI-WSO
- Glossary:WSO
- Glossary:Wrapper-Boundary Register
- Glossary:Wrapper-Bypass Register
- Glossary:Wrapper Instruction Register
- Glossary:XBST
