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Difference between revisions of "Glossary:Boundary Scan Register"
Ian McIntosh (talk | contribs) (Created page with "=== Definition: === A serial shift register composed of boundary scan cells placed between the TDI and TDO of a Glossary:Test Access Port|T...") |
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Latest revision as of 20:40, 25 August 2017
Definition:
A serial shift register composed of boundary scan cells placed between the TDI and TDO of a Test Access Port in an IEEE std 1149.1 compliant component.
Related:
See also: Test Data Register
Source: IEEE 1149.1
