EU Cookie Directive: Please see the following note regarding opting in to the use of cookies for this wiki: EU Cookie Directive

Please Note: You must be logged in to edit this wiki. To login, you must have an account on the SJTAG Forums and have been granted membership of either the Core_WG or the Extended_WG usergroups on the forums. You may then login to the wiki using the same credentials* you use for the forums.

* In some rare cases, it may be necessary to assign a wiki username that is different to your forum username.

Glossary:Built-In Self-Test

Jump to: navigation, search


(BIST) BIST is a method of design-generally for ICs-whereby the mission circuit tests itself. Though this is seldom performed strictly without additional circuitry, if the entire circuitry performing the test is contained within an IC, we call it self-test, in situ test, or built-in self-test.


See also: Built-In Test

Source: A proposed definition from the Testability Management Action Group.

Glossary Index