GDPR, 2018: Please see the revised Pivacy Policy for this wiki: General Data Protection Regulation
Please Note: You must be logged in to edit this wiki and your account must be assigned "editor" rights (set by administrator).
(BIST) BIST is a method of design-generally for ICs-whereby the mission circuit tests itself. Though this is seldom performed strictly without additional circuitry, if the entire circuitry performing the test is contained within an IC, we call it self-test, in situ test, or built-in self-test.
See also: Built-In Test
Source: A proposed definition from the Testability Management Action Group.