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Glossary:Built-In Self-Test

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(BIST) BIST is a method of design-generally for ICs-whereby the mission circuit tests itself. Though this is seldom performed strictly without additional circuitry, if the entire circuitry performing the test is contained within an IC, we call it self-test, in situ test, or built-in self-test.


See also: Built-In Test

Source: A proposed definition from the Testability Management Action Group.

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