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Glossary:Test Access Port
(TAP) A serial data interface defined by IEEE std 1149.1, consisting of four mandatory signals, Test Data In (TDI), Test Data Out (TDO), Test Mode Select (TMS), Test Clock (TCK) and one optional signal, Test Reset (TRST*). This term may be used in reference to the physical connections of either a device, board or system.
Source: IEEE 1149.1