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NTF 2008, the Nordic Test Forum conference, was held in Tallinn, Estonia on 25-26 November, 2008. The venue was the recently opened and appropriately named Nordic Hotel Forum, situated in the city centre, close to the historic Old Town walls.
The Invited Speaker, Professor Einar J. Aas of the Norwegian University of Science and Technology, presented his paper, "Delay Testing - From the Ivory Tower to Tools in the Workshop": As logic speeds increase, test equipment is finding it harder to keep pace, and delay testing offers an alternative method for device manufacturers to test product.
Delay faults also featured in Raimund Ubar's paper, "Fault Modelling and Fault Diagnosis". This was a highly detailed analysis of common fault modelling and diagnosis techniques accompanied by an explanation of methods developed at Tallinn Univeristy of Technology to optimise the activities. However, with over 60 slides in the pack for a half-hour slot, the presentation was obviously a heavily abridged version of the full lecture.
Olde Hansa restaurant. The theme and decor of the establishment is intended to recreate the home of a rich merchant of the Hanseatic League around 1400AD, at a time when Tallinn (then known as Reval) was a major trading port. The menu was also representative of the era with such items as smoked sauerkraut, spicy lentil sauce, wild boar, elk, and bear on offer. The completely candlelit surroundings added to the ambience, but created additional challenges for some of us spectacle wearers!
Nimeta Baar (The Bar with No Name) stayed open well beyond the hotel bar's midnight closing time.
Ian McIntosh, SELEX Galileo and the newly appointed chair of the SJTAG Working Group, presented an updated version of the "SJTAG Backgrounder" (copies of this may be downloaded from the SJTAG website: SJTAG Backgrounder).
Representing both Pickering Interfaces and the LXI Consortium, David Owen presented two papers: The first was an update on the evolution of LXI and the recently approved LXI 1.3 standard, while the second contrasted LXI and PXI switching systems.
Some of the later presentations of the day had to be hurriedly re-arranged to accomodate tight travel schedules of the presenters, and indeed Knut Båtstoløkken, the conference chair, also had to make his closing remarks brief for the same reason.
A full list of the presentations is given below:
|Session ||Presenter ||Title|
|Keynote Address||Bill Ecklow, Cisco Systems||How do we tie chip, board and system test together into a single, "seamless" test process?|
|1 (Invited Speaker)||Einar J Aas, NTNU||Delay Testing – from the Ivory Tower to Tools in the Workshop|
|2.1||Birger Schneider, microLEX Systems||RF testing by a Software-Defined Test Platform for Current and Future Communications Systems|
|2.2||Birger Schneider, microLEX Systems||Digital Audio Measurements Through Efficient FPGA Based Test Techniques|
|2.3||Bernard Sutton, Creative Lighthouse||Eliminate Test|
|3.1||Raimund Ubar, Tallinn University of Technology||Fault Modeling and Fault Diagnosis in Digital Systems|
|3.2||Luca Corli, Seica||Reverse Engineering for Board Test|
|3.3||Mike Smith, Teradyne||Integrating Boundary Scan and Analog Opens techniques|
|-||-||News from Conferences|
|-||Panel Debate||Will structural test finally wipe out the needs for functional test?|
|4.1||Rolf Østvik, AXXE Logistics||PostgreSQL: The World's Most Advanced Open Source Database|
|4.2||Paul Attwell, CIMTEK UK||Magellon Quality Lifecycle Management|
|4.3||Ian McIntosh, SELEX Galileo||SJTAG Backgrounder|
|5.1||Jan Heiber, GOEPEL Electronic||Boundary Scan and Emulation - Complement or Contradiction?|
|5.2||Magnus Björk, Elcoteq Tallinn||Board testing of VDSL2 DSLAM using Boundary Scan|
|5.3||Francesca Gabbani, GEB-GROUP||GEB techniques to fast BScan test Fixture development and manufacturing|
|6.1||David Owen, Pickering Interfaces||LXI Standard Evolution|
|6.2||David Owen, Pickering Interfaces||Comparing LXI and Modular Platforms for Implementation of High Density switching functions|
|6.3||Gary Clayton, MAC-Panel||Modular Mass Interconnect Solutions for LXI|
|7.1||Musab Siddiq, Hapro||Synthetic Instruments - an overview|
|7.2||Martin Viktil, SINTEF||RFID – a tool in logistics. Deployment test|
|7.3||Dr Andre Egbert, Phoenix X-ray||Advanced X-ray Inspection: µAXI and nanofocus Computed Tomography|
NTF 2009 will be held in Stockholm, Sweden, in November.
- Published order: The order of some sessions was changed
- This was the presenter on the day, not necessarily the author of the paper