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Difference between revisions of "Use Case Proposals for P2654"

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(Created page with "Following the format used in Volume 2 of the SJTAG White Paper v2 draft. (Proposed by Jan Schat) == Aging measurement (AME) == === AME Application Fields === === AME Detaile...")
 
(Aging measurement (AME))
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== Aging measurement (AME) ==
 
== Aging measurement (AME) ==
 +
 +
Aging measurement refers to measuring slow, more or less reproducible, more or less deterministic aging processes.
 +
Measurement is usually done locally on a chip, but the aging data may be transferred from client ICs to a host IC using a 2654-compliant interface; the host IC may perform calculation of aging data, initiate counter measures, issue warnings of imminent system fail etc.
 +
 
=== AME Application Fields ===
 
=== AME Application Fields ===
 +
 +
Aging measurement refers to measuring slow, more or less reproducible, more or less deterministic aging processes like
 +
* NBTI (Negative Bias Temperature Instability),
 +
* electromigration,
 +
* HCI (Hot Carrier Injection),
 +
etc.
 +
 
=== AME Detailed Description ===
 
=== AME Detailed Description ===
 
=== AME Alternative Techniques ===
 
=== AME Alternative Techniques ===
 +
 +
Overconstrained robust design that doesn't need aging measurement; non-critical designs that are allowed to fail after a certain life time; redundancy are but a few alternatives.
 +
 
=== AME Tooling Requirements ===
 
=== AME Tooling Requirements ===
 
=== AME Value Proposition ===
 
=== AME Value Proposition ===

Revision as of 09:02, 15 February 2019

Following the format used in Volume 2 of the SJTAG White Paper v2 draft.

(Proposed by Jan Schat)

Aging measurement (AME)

Aging measurement refers to measuring slow, more or less reproducible, more or less deterministic aging processes. Measurement is usually done locally on a chip, but the aging data may be transferred from client ICs to a host IC using a 2654-compliant interface; the host IC may perform calculation of aging data, initiate counter measures, issue warnings of imminent system fail etc.

AME Application Fields

Aging measurement refers to measuring slow, more or less reproducible, more or less deterministic aging processes like

  • NBTI (Negative Bias Temperature Instability),
  • electromigration,
  • HCI (Hot Carrier Injection),

etc.

AME Detailed Description

AME Alternative Techniques

Overconstrained robust design that doesn't need aging measurement; non-critical designs that are allowed to fail after a certain life time; redundancy are but a few alternatives.

AME Tooling Requirements

AME Value Proposition

AME Consequences

Aging mitigation (AMI)

AMI Application Fields

AMI Detailed Description

AMI Alternative Techniques

AMI Tooling Requirements

AMI Value Proposition

AMI Consequences

Counterfeit prevention(CP)

CP Application Fields

CP Detailed Description

CP Alternative Techniques

CP Tooling Requirements

CP Value Proposition

CP Consequences

Recycling prevention (RP)

RP Application Fields

RP Detailed Description

RP Alternative Techniques

RP Tooling Requirements

RP Value Proposition

RP Consequences

Self Test for Functional Safety (FuSa)

FuSa Application Fields

FuSa Detailed Description

FuSa Alternative Techniques

FuSa Tooling Requirements

FuSa Value Proposition

FuSa Consequences