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Difference between revisions of "Volume 2"

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(This document discusses use cases for system level JTAG architecture.)
Line 1: Line 1:
 
<font size='6'>'''Volume 2 - Use Case Document'''</font>
 
<font size='6'>'''Volume 2 - Use Case Document'''</font>
=== Context ===
+
== Context ==
==== About this Document ====
+
=== About this Document ===
 
Text.
 
Text.
==== Documentation Map ====
+
=== Documentation Map ===
 
Readers seeking further information on specific topics are directed to the following volumes:
 
Readers seeking further information on specific topics are directed to the following volumes:
 
* [[Volume_1|Volume 1 – Overview]]
 
* [[Volume_1|Volume 1 – Overview]]
Line 16: Line 16:
 
** Topic 1
 
** Topic 1
  
=== Structural Test ===
+
== Structural Test ==
 
Arguably the most common and most mature use of the JTAG interface and the Boundary Scan resources implemented in IEEE 1149.x compliant devices is what many refer to as "Structural Test".
 
Arguably the most common and most mature use of the JTAG interface and the Boundary Scan resources implemented in IEEE 1149.x compliant devices is what many refer to as "Structural Test".
 
"Structural Test" in this sense refers to the verification of interconnects between digital I/O pins (in the case of IEEE 1149.1) and/or analog or mixed-signal I/O pins (in the case of IEEE 1149.4) on a printed circuit board (PCB) or between PCB's/modules within a system. The purpose of most structural test applications is the detection and diagnosis of quasi-static faults, such as stuck-at-0/1, shorted signals, or open pins.
 
"Structural Test" in this sense refers to the verification of interconnects between digital I/O pins (in the case of IEEE 1149.1) and/or analog or mixed-signal I/O pins (in the case of IEEE 1149.4) on a printed circuit board (PCB) or between PCB's/modules within a system. The purpose of most structural test applications is the detection and diagnosis of quasi-static faults, such as stuck-at-0/1, shorted signals, or open pins.
  
==== Application Fields ====
+
=== Application Fields ===
 
Text here.
 
Text here.
  
==== Detailed Description ====
+
=== Detailed Description ===
 
Text here.
 
Text here.
  
==== Alternative Techniques ====
+
=== Alternative Techniques ===
 
Text here.
 
Text here.
  
==== Tooling Requirements ====
+
=== Tooling Requirements ===
 
Text here.
 
Text here.
  
==== Value Proposition ====
+
=== Value Proposition ===
 
Text here.
 
Text here.
  
=== Configuration/Tuning/Instrumentation  ===
+
== Configuration/Tuning/Instrumentation  ==
 
Text.
 
Text.
  
==== Application Fields ====
+
=== Application Fields ===
 
Text here.
 
Text here.
  
==== Detailed Description ====
+
=== Detailed Description ===
 
Text here.
 
Text here.
  
==== Alternative Techniques ====
+
=== Alternative Techniques ===
 
Text here.
 
Text here.
  
==== Tooling Requirements ====
+
=== Tooling Requirements ===
 
Text here.
 
Text here.
  
==== Value Proposition ====
+
=== Value Proposition ===
 
Text here.
 
Text here.
  
=== Software Debug  ===
+
== Software Debug  ==
 
Text.
 
Text.
  
==== Application Fields ====
+
=== Application Fields ===
 
Text here.
 
Text here.
  
==== Detailed Description ====
+
=== Detailed Description ===
 
Text here.
 
Text here.
  
==== Alternative Techniques ====
+
=== Alternative Techniques ===
 
Text here.
 
Text here.
  
==== Tooling Requirements ====
+
=== Tooling Requirements ===
 
Text here.
 
Text here.
  
==== Value Proposition ====
+
=== Value Proposition ===
 
Text here.
 
Text here.
  
=== Built-In Self Test  ===
+
== Built-In Self Test  ==
 
Text.
 
Text.
  
==== Application Fields ====
+
=== Application Fields ===
 
Text here.
 
Text here.
  
==== Detailed Description ====
+
=== Detailed Description ===
 
Text here.
 
Text here.
  
==== Alternative Techniques ====
+
=== Alternative Techniques ===
 
Text here.
 
Text here.
  
==== Tooling Requirements ====
+
=== Tooling Requirements ===
 
Text here.
 
Text here.
  
==== Value Proposition ====
+
=== Value Proposition ===
 
Text here.
 
Text here.
  
=== Fault Injection  ===
+
== Fault Injection  ==
 
Text.
 
Text.
  
==== Application Fields ====
+
=== Application Fields ===
 
Text here.
 
Text here.
  
==== Detailed Description ====
+
=== Detailed Description ===
 
Text here.
 
Text here.
  
==== Alternative Techniques ====
+
=== Alternative Techniques ===
 
Text here.
 
Text here.
  
==== Tooling Requirements ====
+
=== Tooling Requirements ===
 
Text here.
 
Text here.
  
==== Value Proposition ====
+
=== Value Proposition ===
 
Text here.
 
Text here.
  
=== Programming/Updates  ===
+
== Programming/Updates  ==
 
Text.
 
Text.
  
==== Application Fields ====
+
=== Application Fields ===
 
Text here.
 
Text here.
  
==== Detailed Description ====
+
=== Detailed Description ===
 
Text here.
 
Text here.
  
==== Alternative Techniques ====
+
=== Alternative Techniques ===
 
Text here.
 
Text here.
  
==== Tooling Requirements ====
+
=== Tooling Requirements ===
 
Text here.
 
Text here.
  
==== Value Proposition ====
+
=== Value Proposition ===
 
Text here.
 
Text here.
  
=== Root Cause Analysis/Failure Mode Analysis  ===
+
== Root Cause Analysis/Failure Mode Analysis  ==
 
Text.
 
Text.
  
==== Application Fields ====
+
=== Application Fields ===
 
Text here.
 
Text here.
  
==== Detailed Description ====
+
=== Detailed Description ===
 
Text here.
 
Text here.
  
==== Alternative Techniques ====
+
=== Alternative Techniques ===
 
Text here.
 
Text here.
  
==== Tooling Requirements ====
+
=== Tooling Requirements ===
 
Text here.
 
Text here.
  
==== Value Proposition ====
+
=== Value Proposition ===
 
Text here.
 
Text here.
  
=== Power-on Self Test  ===
+
== Power-on Self Test  ==
 
Text.
 
Text.
  
==== Application Fields ====
+
=== Application Fields ===
 
Text here.
 
Text here.
  
==== Detailed Description ====
+
=== Detailed Description ===
 
Text here.
 
Text here.
  
==== Alternative Techniques ====
+
=== Alternative Techniques ===
 
Text here.
 
Text here.
  
==== Tooling Requirements ====
+
=== Tooling Requirements ===
 
Text here.
 
Text here.
  
==== Value Proposition ====
+
=== Value Proposition ===
 
Text here.
 
Text here.
  
=== Environmental Stress Test  ===
+
== Environmental Stress Test  ==
 
Text.
 
Text.
  
==== Application Fields ====
+
=== Application Fields ===
 
Text here.
 
Text here.
  
==== Detailed Description ====
+
=== Detailed Description ===
 
Text here.
 
Text here.
  
==== Alternative Techniques ====
+
=== Alternative Techniques ===
 
Text here.
 
Text here.
  
==== Tooling Requirements ====
+
=== Tooling Requirements ===
 
Text here.
 
Text here.
  
==== Value Proposition ====
+
=== Value Proposition ===
 
Text here.
 
Text here.
  
=== Device Versioning  ===
+
== Device Versioning  ==
 
Text.
 
Text.
  
==== Application Fields ====
+
=== Application Fields ===
 
Text here.
 
Text here.
  
==== Detailed Description ====
+
=== Detailed Description ===
 
Text here.
 
Text here.
  
==== Alternative Techniques ====
+
=== Alternative Techniques ===
 
Text here.
 
Text here.
  
==== Tooling Requirements ====
+
=== Tooling Requirements ===
 
Text here.
 
Text here.
  
==== Value Proposition ====
+
=== Value Proposition ===
 
Text here.
 
Text here.

Revision as of 15:23, 16 June 2008

Volume 2 - Use Case Document

Contents

Context

About this Document

Text.

Documentation Map

Readers seeking further information on specific topics are directed to the following volumes:

Structural Test

Arguably the most common and most mature use of the JTAG interface and the Boundary Scan resources implemented in IEEE 1149.x compliant devices is what many refer to as "Structural Test". "Structural Test" in this sense refers to the verification of interconnects between digital I/O pins (in the case of IEEE 1149.1) and/or analog or mixed-signal I/O pins (in the case of IEEE 1149.4) on a printed circuit board (PCB) or between PCB's/modules within a system. The purpose of most structural test applications is the detection and diagnosis of quasi-static faults, such as stuck-at-0/1, shorted signals, or open pins.

Application Fields

Text here.

Detailed Description

Text here.

Alternative Techniques

Text here.

Tooling Requirements

Text here.

Value Proposition

Text here.

Configuration/Tuning/Instrumentation

Text.

Application Fields

Text here.

Detailed Description

Text here.

Alternative Techniques

Text here.

Tooling Requirements

Text here.

Value Proposition

Text here.

Software Debug

Text.

Application Fields

Text here.

Detailed Description

Text here.

Alternative Techniques

Text here.

Tooling Requirements

Text here.

Value Proposition

Text here.

Built-In Self Test

Text.

Application Fields

Text here.

Detailed Description

Text here.

Alternative Techniques

Text here.

Tooling Requirements

Text here.

Value Proposition

Text here.

Fault Injection

Text.

Application Fields

Text here.

Detailed Description

Text here.

Alternative Techniques

Text here.

Tooling Requirements

Text here.

Value Proposition

Text here.

Programming/Updates

Text.

Application Fields

Text here.

Detailed Description

Text here.

Alternative Techniques

Text here.

Tooling Requirements

Text here.

Value Proposition

Text here.

Root Cause Analysis/Failure Mode Analysis

Text.

Application Fields

Text here.

Detailed Description

Text here.

Alternative Techniques

Text here.

Tooling Requirements

Text here.

Value Proposition

Text here.

Power-on Self Test

Text.

Application Fields

Text here.

Detailed Description

Text here.

Alternative Techniques

Text here.

Tooling Requirements

Text here.

Value Proposition

Text here.

Environmental Stress Test

Text.

Application Fields

Text here.

Detailed Description

Text here.

Alternative Techniques

Text here.

Tooling Requirements

Text here.

Value Proposition

Text here.

Device Versioning

Text.

Application Fields

Text here.

Detailed Description

Text here.

Alternative Techniques

Text here.

Tooling Requirements

Text here.

Value Proposition

Text here.