GDPR, 2018: Please see the revised Pivacy Policy for this wiki: General Data Protection Regulation
EU Cookie Directive: Please see the following note regarding opting in to the use of cookies for this wiki: EU Cookie Directive

Please Note: You must be logged in to edit this wiki and your account must be assigned "editor" rights (set by administrator).

Volume 2

From SJTAG
Revision as of 15:23, 16 June 2008 by Ian McIntosh (talk | contribs)
Jump to: navigation, search

Volume 2 - Use Case Document

Contents

Context

About this Document

Text.

Documentation Map

Readers seeking further information on specific topics are directed to the following volumes:

Structural Test

Arguably the most common and most mature use of the JTAG interface and the Boundary Scan resources implemented in IEEE 1149.x compliant devices is what many refer to as "Structural Test". "Structural Test" in this sense refers to the verification of interconnects between digital I/O pins (in the case of IEEE 1149.1) and/or analog or mixed-signal I/O pins (in the case of IEEE 1149.4) on a printed circuit board (PCB) or between PCB's/modules within a system. The purpose of most structural test applications is the detection and diagnosis of quasi-static faults, such as stuck-at-0/1, shorted signals, or open pins.

Application Fields

Text here.

Detailed Description

Text here.

Alternative Techniques

Text here.

Tooling Requirements

Text here.

Value Proposition

Text here.

Configuration/Tuning/Instrumentation

Text.

Application Fields

Text here.

Detailed Description

Text here.

Alternative Techniques

Text here.

Tooling Requirements

Text here.

Value Proposition

Text here.

Software Debug

Text.

Application Fields

Text here.

Detailed Description

Text here.

Alternative Techniques

Text here.

Tooling Requirements

Text here.

Value Proposition

Text here.

Built-In Self Test

Text.

Application Fields

Text here.

Detailed Description

Text here.

Alternative Techniques

Text here.

Tooling Requirements

Text here.

Value Proposition

Text here.

Fault Injection

Text.

Application Fields

Text here.

Detailed Description

Text here.

Alternative Techniques

Text here.

Tooling Requirements

Text here.

Value Proposition

Text here.

Programming/Updates

Text.

Application Fields

Text here.

Detailed Description

Text here.

Alternative Techniques

Text here.

Tooling Requirements

Text here.

Value Proposition

Text here.

Root Cause Analysis/Failure Mode Analysis

Text.

Application Fields

Text here.

Detailed Description

Text here.

Alternative Techniques

Text here.

Tooling Requirements

Text here.

Value Proposition

Text here.

Power-on Self Test

Text.

Application Fields

Text here.

Detailed Description

Text here.

Alternative Techniques

Text here.

Tooling Requirements

Text here.

Value Proposition

Text here.

Environmental Stress Test

Text.

Application Fields

Text here.

Detailed Description

Text here.

Alternative Techniques

Text here.

Tooling Requirements

Text here.

Value Proposition

Text here.

Device Versioning

Text.

Application Fields

Text here.

Detailed Description

Text here.

Alternative Techniques

Text here.

Tooling Requirements

Text here.

Value Proposition

Text here.